Small-Angle Scattering Short Course 2008
"Beyond RG "
June 28-July 2, 2008
Advanced Photon Source, Argonne National Laboratory
Download pdf brochure with information
Sorry, registration closed, the course has filled in on 3/18/2008!
The objective of the Small-Angle Scattering Short Course 2008 is to raise the capabilities of the small-angle scattering (SAS) community by providing an intermediate-level course for those in need of a better understanding of SAS theory, and techniques utilized at the APS.
The SAS short course offers an overview of SAS theory, capabilities, and data reduction and analysis tools to enable the community to submit highly effective beam-time proposals and to facilitate better utilization of the resources at the APS.
The course includes hands-on experiments at a selected APS small-angle x-ray scattering facility, and data reduction and evaluation.
Participants are expected to have attained at least a post-doctoral-level education and are encouraged to have a defined experimental program so that they can collect data for a set of samples that they bring.
Lecturers will be available during hands-on workshops for one-on-one discussion and experiments. A CD (for Windows systems) with examples of data reduction and analysis software, which participants will be able to use during and after the workshop, will be provided. Participants are encouraged to bring their own notebook computers.
Registration fee: $0 (free)
Number of participants is limited to 25. If needed, organizers
reserve the right to select participants.
||February 15, 2008
||May 15, 2008
Information about acceptance of registration will be sent to participants before May 22, 2008.
Participants will be responsible for their own transportation,
accommodations, and meal costs.
A limited number of rooms has been reserved at the Argonne
Guest House: http://www.anlgh.org/
Phone: 800.632.8990 or 630.739.6000
Participants are responsible for reserving these rooms.
SAS INTEREST GROUP
Argonne National Laboratory
9700 S. Cass Ave., Bldg. 438E
Argonne, IL U.S.A.
attn: Jan Ilavsky
Phone: 630.252.0866 • Fax: 630.252.0862
The Dow Chemical Company
APS X-ray science division |
Rayonix LLC / Mar USA
|June 28: (Optional)
|June 30-July 2:
||Lectures, data reduction, and modeling
Small-Angle Scattering Fundamentals
Sample Preparation and Experiments
Overview of Available Instrumentation and Techniques
Data Reduction Tools
Data Analysis Tools
Scientific Lectures on SAS in Materials Science, Chemistry, Biology, and Polymer Science
Strategies to Write Successful Beam-Time Proposals
Dale Schaefer, University of Cincinnati
Sunil K. Sinha, University of California, San Diego
Thiyaga P. Thiyagarajan, Argonne
David Tiede, Argonne
Randall E. Winans, Argonne
Byeongdu Lee, Argonne
Jan Ilavsky, Argonne
Peter R. Jemian, Argonne
USAXS (32-ID), Materials Science SAXS, Bio SAXS
“Irena” & “Nika” (http://usaxs.xray.aps.anl.gov/staff/ilavsky/index.html)
NIST SAS package (http://www.ncnr.nist.gov/programs/sans/data/red_anal.html)
Top image: Small-angle scattering from aerogel as a function of axial or radial strain
(courtesy of Johannes Pollanen, Northwestern University).
Middle image: Speckle pattern from coherent beam scattering of an aerogel
(courtesy of L. Lurio, Northern Illinois University).
Bottom image: Key polyethylene crystalline and lamellae deformation mechanisms
(courtesy of Brian Landes, Dow Chemical).