Small-Angle Scattering Short Course 2013

"Beyond RG "

October 26 - 31, 2013
Advanced Photon Source, Argonne National Laboratory

Report and course materials for participants

Program (pdf)

SAS imagesThe objective of the Small-Angle Scattering Short Course 2013 is to raise the capabilities of the small-angle scattering (SAS) and grazing-incidence SAXS (GISAXS) community by providing an intermediate-level course for those in need of a better understanding of SAS & GISAXS theory, and techniques utilized at the APS.


The SAS short course offers an overview of SAS & GISAXS theory, capabilities, and data reduction and analysis tools to enable the community to submit highly effective beam-time proposals and to facilitate better utilization of the resources at the APS.


The course includes hands-on experiments at a selected APS small-angle x-ray scattering facility, and data reduction and evaluation.


Participants are expected to have attained at least a post-doctoral-level education and are encouraged to have a defined experimental program so that they can collect data for a set of samples that they bring.


Lecturers will be available during hands-on workshops for one-on-one discussion and experiments. A CD (for Windows systems) with examples of data reduction and analysis software, which participants will be able to use during and after the workshop, will be provided. Participants are encouraged to bring their own notebook computers.


Registration fee: $0 (free)
Number of participants is limited to 25 - 30. If needed, organizers reserve the right to select participants.

Registration opens: April 4, 2013
Registration deadline: June 1, 2013


Participants will be responsible for their own transportation, accommodations, and meal costs. A limited number of rooms has been reserved at the Argonne Guest House: http://www.anlgh.org/

Phone: 800.632.8990 or 630.739.6000
Fax: 630.739.1000
Email: argonne-guest-house@anl.gov

Participants are responsible for reserving these rooms.


For answers to questions or for more information contact:

Rachel Reed
Argonne National Laboratory
9700 S. Cass Ave., Bldg. 401
Argonne, IL U.S.A.

rreed@aps.anl.gov or apsuser@aps.anl.gov

http://small-angle.aps.anl.gov/


SPONSORS:



APS X-ray science division

COURSE SCHEDULE

October 26 - 27, 2013 (Optional) Experiments
October 28 - 29, 2013 General lectures (theory, applications, etc.)
October 30 - 31 (noon), 2013

Software for data reduction, analysis, modeling in groups:
1. BIOSAXS (ATSAS)
2. Materials in transmission SAXS (Irena, Nika)
3. Materials in GISAXS (TBA)

SYLLABUS

Small-Angle Scattering Fundamentals
Sample Preparation and Experiments
Overview of Available Instrumentation and Techniques
Data Reduction Tools
Data Analysis Tools
Scientific Lectures on SAS in Materials Science, Chemistry, Biology, and Polymer Science
Strategies to Write Successful Beam-Time Proposals

SPEAKERS

Peter R. Jemian, Argonne
David Tiede, Argonne
Randall E. Winans, Argonne
Byeongdu Lee, Argonne
Jan Ilavsky, Argonne
and other APS XSD and APS CAT's staff members

PARTICIPATING BEAMLINES

Bonse-Hart USAXS: 15-ID (ChemMatCARS & XSD, http://usaxs.xray.aps.anl.gov)
Pinhole SAXS / GISAXS:

5-ID (DND-CAT, http://www.dnd.aps.anl.gov/)
12-ID (XSD, http://cep.xray.aps.anl.gov/)
18-ID (Bio-CAT, http://www.bio.aps.anl.gov/)
8-ID (XSD, http://www.aps.anl.gov/Sectors/Sector8/)

Details on the beamlines: http://small-angle.aps.anl.gov/aps_beam_lines.html

EXPERIMENTAL TECHNIQUES

USAXS (15-ID), Materials Science SAXS, Bio SAXS, GISAXS

SOFTWARE

“Irena” & “Nika” (http://usaxs.xray.aps.anl.gov/staff/ilavsky/index.html)
(TBA) isGISAXS (http://ln-www.insp.upmc.fr/axe4/Oxydes/IsGISAXS/isgisaxs.htm)
ATSAS (http://www.embl-hamburg.de/ExternalInfo/Research/Sax/software.html)

ILLUSTRATIONS

Top image: Small-angle scattering from aerogel as a function of axial or radial strain (courtesy of Johannes Pollanen, Northwestern University).
GISAXS from a two-dimensional nanocrystal superlattice self-assembled at the liquid-air interface during evaporation (courtesy of Joseph Strzalka, APS)
Bottom image: Key polyethylene crystalline and lamellae deformation mechanisms (courtesy of Brian Landes, Dow Chemical).