Small-Angle Scattering Short Course 2008

"Beyond RG "

June 28-July 2, 2008
Advanced Photon Source, Argonne National Laboratory

Photo of participants

Download 2008 pdf brochure with information

Download high resolution photo (2.8 Mb) of the participants

Download final program


SAS imagesThe objective of the Small-Angle Scattering Short Course 2008 was to raise the capabilities of the small-angle scattering (SAS) community by providing an intermediate-level course for those in need of a better understanding of SAS theory, and techniques utilized at the APS.
The SAS short course offered an overview of SAS theory, capabilities, and data reduction and analysis tools to enable the community to submit highly effective beam-time proposals and to facilitate better utilization of the resources at the APS.
The course included hands-on experiments at a selected APS small-angle x-ray scattering facility, and data reduction and evaluation.

About 40 participants listened to lecturers as well as participated in hands-on workshops in one-on-one discussion. Further two days of beam time were provided for experiments on participants samples by foru APS beamlines. A CD (for Windows systems) with examples of data reduction and analysis software, which participants was provided as well as CD with pdf files with all talks.

Registration fee: $0 (free)


Argonne National Laboratory
9700 S. Cass Ave., Bldg. 438E
Argonne, IL U.S.A.
attn: Jan Ilavsky
Phone: 630.252.0866 • Fax: 630.252.0862


The Dow Chemical Company

APS X-ray science division
Rayonix LLC / Mar USA



Small-Angle Scattering Fundamentals
Sample Preparation and Experiments
Overview of Available Instrumentation and Techniques
Data Reduction Tools
Data Analysis Tools
Scientific Lectures on SAS in Materials Science, Chemistry, Biology, and Polymer Science
Strategies to Write Successful Beam-Time Proposals


Dale Schaefer, University of Cincinnati
Thiyaga P. Thiyagarajan, Argonne
David Tiede, Argonne
Randall E. Winans, Argonne
Byeongdu Lee, Argonne
Jan Ilavsky, Argonne
Peter R. Jemian, Argonne


Bonse-Hart USAXS: 32-ID (XOR,
Pinhole SAXS:

12-ID (XOR,
18-ID (Bio-CAT,

Details on the beamlines:


USAXS (32-ID), Materials Science SAXS, Bio SAXS


“Irena” & “Nika” (
NIST SAS package (


Top image: Small-angle scattering from aerogel as a function of axial or radial strain (courtesy of Johannes Pollanen, Northwestern University).
Middle image: Speckle pattern from coherent beam scattering of an aerogel (courtesy of L. Lurio, Northern Illinois University).
Bottom image: Key polyethylene crystalline and lamellae deformation mechanisms (courtesy of Brian Landes, Dow Chemical).